DIFF Subgroup
G01Q 60/42 Functionalisation
Introduced: January 2010
Full Title
Full titles differ between systems:
IPC:
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes > Probes, their manufacture or their related instrumentation, e.g. holders > Functionalisation
CPC:
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes > Probes, their manufacture, or their related instrumentation, e.g. holders > Functionalisation
No child classifications to compare. This is a leaf node in both IPC and CPC.