AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

Introduced: January 2010

Full Title

Full titles differ between systems:

IPC:

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

CPC:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

IPC and CPC are identically structured here. All 6 subcodes exist in both systems.

1 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 2010.

Child Classifications

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G01Q 60/26 Friction force microscopy since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/28 Adhesion force microscopy since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/30 Scanning potential microscopy since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/32 AC mode since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/36 DC mode since 2010 +2 CPC IPC+CPC Available in IPC and CPC
G01Q 60/38 Probes, their manufacture, or their related instrumentation, e.g. holders since 2010 IPC+CPC Available in IPC and CPC