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PCE
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DIFF Subgroup
G01R 31/265

Contactless testing

Introduced: January 1995

Full Title

Full titles differ between systems:

IPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of individual semiconductor devices > Contactless testing

CPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment ) > Contactless testing

Of 2 combined children, 0 exist in both systems.

2 codes are CPC-only extensions.

Child Classifications

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