Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )

Introduced: September 1968

Title

Titles differ between systems:

IPC: Testing of individual semiconductor devices

CPC: Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )

Full Title

Full titles differ between systems:

IPC:

CPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )

CPC subdivides this area 4x more granularly than IPC with 6 additional codes.

6 codes are CPC-only extensions.

1 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 1995.

Child Classifications

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G01R 31/2601 +1 CPC CPC only CPC only
G01R 31/2607 +6 CPC CPC only CPC only
G01R 31/2642 CPC only CPC only
G01R 31/2644 CPC only CPC only
G01R 31/2646 CPC only CPC only
G01R 31/2648 CPC only CPC only
G01R 31/265 Contactless testing since 1995 +2 CPC IPC+CPC Available in IPC and CPC
G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements since 1995 +1 CPC IPC+CPC Available in IPC and CPC