G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
Introduced: January 1995
Title
Titles differ between systems:
IPC: Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements
CPC: Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
Full Title
Full titles differ between systems:
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of individual semiconductor devices > Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment ) > Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
Of 1 combined children, 0 exist in both systems.
1 codes are CPC-only extensions.
Child Classifications
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