Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of individual semiconductor devices > Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES