G11C 29/12 Built-in arrangements for testing, e.g. built-in self testing [BIST]
Introduced: January 2006
Full Title
Full titles differ between systems:
Checking stores for correct operation; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Built-in arrangements for testing, e.g. built-in self testing [BIST]
Checking stores for correct operation ; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Built-in arrangements for testing, e.g. built-in self testing [BIST]
CPC subdivides this area 2x more granularly than IPC with 8 additional codes.
8 codes are CPC-only extensions.
Note: 5 CPC extensions are marked as secondary classification only.
IPC defines codes here since 2006.
Child Classifications
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- G11C 29/14 Implementation of control logic, e.g. test mode decoders since 2006 IPC+CPC Available in IPC and CPC
- G11C 29/18 Address generation devices; Devices for accessing memories, e.g. details of addressing circuits since 2006 +3 CPC IPC+CPC Available in IPC and CPC
- G11C 29/36 Data generation devices, e.g. data inverters since 2006 +1 CPC IPC+CPC Available in IPC and CPC
- G11C 29/44 Indication or identification of errors, e.g. for repair since 2006 +1 CPC IPC+CPC Available in IPC and CPC