Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Child Classifications

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• G11C 29/10 Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns since 2006 IPC+CPC Available in IPC and CPC
• G11C 29/12 Built-in arrangements for testing, e.g. built-in self testing [BIST] since 2006 +8 CPC IPC+CPC Available in IPC and CPC
• G11C 29/48 Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths since 2006 IPC+CPC Available in IPC and CPC