DIFF Subgroup
H10P 54/30 by forming weakened zones for subsequent cutting or separating, e.g. by laser treatment or by ion implantation
Introduced: January 2026
Full Title
Cutting or separating of wafers, substrates or parts of devices > by forming weakened zones for subsequent cutting or separating, e.g. by laser treatment or by ion implantation
No child classifications to compare. This is a leaf node in both IPC and CPC.