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PCE
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IPC Subgroup
H10P 54/3

by forming weakened zones for subsequent cutting or separating, e.g. by laser treatment or by ion implantation

Introduced: January 2026

Full Title

Cutting or separating of wafers, substrates or parts of devices > by forming weakened zones for subsequent cutting or separating, e.g. by laser treatment or by ion implantation

Classification Context

Section:
ELECTRICITY
Class:
SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
Subclass:
GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS