DIFF Subgroup
H10P 74/20 characterised by the properties tested or measured, e.g. structural or electrical properties
Introduced: January 2026
Full Title
Testing or measuring during manufacture or treatment of wafers, substrates or devices > characterised by the properties tested or measured, e.g. structural or electrical properties
Of 2 combined children, 0 exist in both systems.
2 codes are CPC-only extensions.
Child Classifications
Navigate with arrow keys, Enter to open