characterised by the properties tested or measured, e.g. structural or electrical properties

Full Title

Testing or measuring during manufacture or treatment of wafers, substrates or devices > characterised by the properties tested or measured, e.g. structural or electrical properties

Classification Context

Section:

ELECTRICITY

Class:

SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR

Subclass:

GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS