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IPC Main Group
G01B 11/00

Measuring arrangements characterised by the use of optical techniques

Introduced: September 1968

Last revised: January 2006

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

9 direct subcodes

Child Classifications

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  • G01B 11/14 for measuring distance or clearance between spaced objects or spaced apertures
  • G01B 11/16 for measuring the deformation in a solid, e.g. optical strain gauge
  • G01B 11/22 for measuring depth
  • G01B 11/28 for measuring areas
  • G01B 11/3 for measuring roughness or irregularity of surfaces

Top Applicants

Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SGCC(STATE GRID CORPORATION OF CHINA) 41,447
  2. CHINESE ACADEMY OF SCIENCES 32,952
  3. ROBERT BOSCH DE 16,470
  4. SAMSUNG ELECTRONICS COMPANY KR 10,052
  5. SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
  6. ZHEJIANG UNIVERSITY 9,529
  7. GUANGDONG POWER GRID CORPORATION 8,615
  8. TSINGHUA UNIVERSITY 7,805
  9. HALLIBURTON ENERGY SERVICES GROUP US 7,796
  10. QUALCOMM US 7,171