G01B 9/02 Interferometers
Introduced: September 1968
Last revised: January 2022
Full Title
Measuring instruments characterised by the use of optical techniques > Interferometers
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Additional Content
Apparatus for testing the eyes; Instruments for examining the eyes Fabry-Perot interferometers Interferometric spectrometry Using interferometric methods to measure optical phase difference, determine degree of coherence or measure optical wavelength Investigating or analysing materials using interferometric methods involving refractivity or phase-affecting properties Interference filters Devices for the control of the intensity, phase, polarisation or colour, by interference Depth or shape recovery in image analysis from laser ranging, e.g. using interferometry
Related Keywords
6 direct subcodes
Child Classifications
Navigate with arrow keys, Enter to open
- G01B 9/02001 characterised by controlling or generating intrinsic radiation properties
- G01B 9/02015 characterised by the beam path configuration
- G01B 9/02055 Reduction or prevention of errors; Testing; Calibration
- G01B 9/0209 Low-coherence interferometers
- G01B 9/02097 Self-interferometers
- G01B 9/021 using holographic techniques
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171