G01K 7/01 using semiconducting elements having PN junctions
Introduced: January 1995
Last revised: January 2006
Full Title
Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat > using semiconducting elements having PN junctions
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Filing statistics
IPC G01K 7/01 belongs to the parent subclass G01K, which recorded 118,108 patent applications worldwide between 2013 and 2023. Annual filings grew from 5,775 in 2013 to 14,309 in 2023 (+148%), peaking at 17,527 applications in 2020. The most active applicants in class G01 are SGCC(STATE GRID CORPORATION OF CHINA) (41,447 applications), CHINESE ACADEMY OF SCIENCES (32,952 applications) and ROBERT BOSCH (16,470 applications).
Source: EPO PATSTAT, worldwide filings
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171