Sample holders or supports therefor

Full Title

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials > Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor > Sample holders or supports therefor

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Child Classifications

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• G01N 23/20033 provided with temperature control or heating means
• G01N 23/20041 for high pressure testing, e.g. anvil cells