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IPC Subgroup
G01N 23/205

using diffraction cameras

Introduced: July 1974

Last revised: January 2018

Full Title

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials > using diffraction cameras

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES