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IPC Subgroup
G06F 11/263

Generation of test inputs, e.g. test vectors, patterns or sequences

Introduced: January 1995

Last revised: January 2006

Full Title

Error detection; Error correction; Monitoring > Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing > Functional testing > Generation of test inputs, e.g. test vectors, patterns or sequences

Classification Context

Section:
PHYSICS
Class:
COMPUTING OR CALCULATING; COUNTING
Subclass:
ELECTRIC DIGITAL DATA PROCESSING