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IPC Subgroup
G06F 11/263

Generation of test inputs, e.g. test vectors, patterns or sequences

Introduced: January 1995

Last revised: January 2006

Full Title

Error detection; Error correction; Monitoring > Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing > Functional testing > Generation of test inputs, e.g. test vectors, patterns or sequences

Classification Context

Section:
PHYSICS
Class:
COMPUTING OR CALCULATING; COUNTING
Subclass:
ELECTRIC DIGITAL DATA PROCESSING

Top Applicants

Top 10 applicants by patent filingsfor class G06, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SAMSUNG ELECTRONICS COMPANY KR 66,669
  2. IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 62,313
  3. MICROSOFT TECHNOLOGY LICENSING US 41,918
  4. GOOGLE US 32,969
  5. SGCC(STATE GRID CORPORATION OF CHINA) 30,822
  6. INTEL CORPORATION US 30,010
  7. TENCENT TECHNOLOGY (SHENZHEN) COMPANY 28,235
  8. HUAWEI TECHNOLOGIES COMPANY CN 26,079
  9. APPLE US 21,891
  10. HUAWEI TECHNOLOGIES COMPANY 20,505