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IPC Subgroup
G06F 11/26

Functional testing

Introduced: January 1980

Last revised: January 2006

Full Title

Error detection; Error correction; Monitoring > Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing > Functional testing

Classification Context

Section:
PHYSICS
Class:
COMPUTING OR CALCULATING; COUNTING
Subclass:
ELECTRIC DIGITAL DATA PROCESSING

4 direct subcodes

Child Classifications

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  • G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences
  • G06F 11/267 Reconfiguring circuits for testing, e.g. LSSD, partitioning
  • G06F 11/27 Built-in tests