CPC Subgroup
G01Q 60/08 MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
Full Title
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > Multiple-type SPM, i.e. involving more than one SPM techniques > MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382