CPC Main Group
G01Q 60/00 Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
9 direct subcodes
Child Classifications
Navigate with arrow keys, Enter to open
- G01Q 60/02 Multiple-type SPM, i.e. involving more than one SPM techniques
- G01Q 60/10 STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q 60/18 SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q 60/44 SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
- G01Q 60/46 SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes
- G01Q 60/50 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
- G01Q 60/58 SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
- G01Q 60/60 SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes