Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof

Child Classifications

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• G01Q 60/02 Multiple-type SPM, i.e. involving more than one SPM techniques
• G01Q 60/10 STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
• G01Q 60/18 SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
• G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
• G01Q 60/44 SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
• G01Q 60/46 SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes
• G01Q 60/50 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
• G01Q 60/58 SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
• G01Q 60/60 SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes