G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
Description
Covers scanning-probe microscopy and related techniques that use a fine probe to mechanically or electrochemically interact with a sample surface to obtain topographical, electrical, magnetic, or chemical information at micro- and nanoscale resolution. Includes atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near-field optical microscopy (SNOM), and similar probe-based characterization methods. Encompasses both apparatus design (probe configurations, positioning mechanisms, signal detection systems) and methodology for materials analysis, surface imaging, and nanoscale manipulation. Excludes conventional optical or electron microscopy techniques covered in G01B and other measurement systems not based on scanning-probe interaction principles.
Filing statistics
CPC subclass G01Q recorded 5,436 patent applications worldwide between 2013 and 2023. Annual filings grew from 409 in 2013 to 407 in 2023 (+0%), peaking at 596 applications in 2018. The most active applicants in class G01 are CHINESE ACADEMY OF SCIENCES (21,460 applications), ROBERT BOSCH (17,801 applications) and SGCC(STATE GRID CORPORATION OF CHINA) (17,347 applications).
Source: EPO PATSTAT, worldwide filings
8 direct subcodes
Child Classifications
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- G01Q 10/00 Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q 20/00 Monitoring the movement or position of the probe
- G01Q 30/00 Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q 40/00 Calibration, e.g. of probes
- G01Q 60/00 Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q 70/00 General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q 80/00 Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08)
- G01Q 90/00 Scanning-probe techniques or apparatus not otherwise provided for
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382