IPC Subgroup
G01R 31/26 Testing of individual semiconductor devices
Introduced: September 1968
Last revised: January 2020
Full Title
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of individual semiconductor devices
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
Additional Content
Glossary
individual semiconductor device individual semiconductor devices basic semiconductor component or building block such as a diode or a transistor
Limiting references
Testing of photovoltaic devices Testing or measuring during manufacture or treatment
Related Keywords
testing SEMICONDUCTOR(S) devices
2 direct subcodes
Child Classifications
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- G01R 31/265 Contactless testing
- G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171