Contactless testing

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 ) > Contactless testing

Child Classifications

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• G01R 31/3025
• G01R 31/303 of integrated circuits (G01R31/305 - G01R31/315 take precedence)
• G01R 31/304 of printed or hybrid circuits (G01R31/305 - G01R31/315 take precedence)
• G01R 31/305 using electron beams
• G01R 31/308 using non-ionising electromagnetic radiation, e.g. optical radiation
• G01R 31/312 by capacitive methods
• G01R 31/315 by inductive methods