Contactless testing

Introduced: January 1990

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Contactless testing

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

Related Keywords

contactless TESTING of electronic circuits

6 direct subcodes

Child Classifications

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G01R 31/303 of integrated circuits
G01R 31/304 of printed or hybrid circuits
G01R 31/305 using electron beams
G01R 31/308 using non-ionising electromagnetic radiation, e.g. optical radiation
G01R 31/312 by capacitive methods
G01R 31/315 by inductive methods