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DIFF Subgroup
G01R 31/302

Contactless testing

Introduced: January 1990

Full Title

Full titles differ between systems:

IPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Contactless testing

CPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 ) > Contactless testing

Of 7 combined children, 6 exist in both systems.

1 codes are CPC-only extensions.

2 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 1990.

Child Classifications

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  • G01R 31/3025 CPC only CPC only
  • G01R 31/303 of integrated circuits (G01R31/305 - G01R31/315 take precedence) since 1995 IPC+CPC Available in IPC and CPC
  • G01R 31/304 of printed or hybrid circuits (G01R31/305 - G01R31/315 take precedence) since 1995 IPC+CPC Available in IPC and CPC
  • G01R 31/312 by capacitive methods since 1990 IPC+CPC Available in IPC and CPC
  • G01R 31/315 by inductive methods since 1990 IPC+CPC Available in IPC and CPC