CPC Subgroup Additional Only
H01J 2237/244 Detection characterized by the detecting means
Full Title
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging > Detection characterized by the detecting means
13 direct subcodes
Child Classifications
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- H01J 2237/24405 Faraday cages
- H01J 2237/2441 Semiconductor detectors, e.g. diodes
- H01J 2237/2443 Scintillation detectors
- H01J 2237/24435 Microchannel plates
- H01J 2237/2444 Electron Multiplier
- H01J 2237/2445 Photon detectors for X-rays, light, e.g. photomultipliers
- H01J 2237/24455 Transmitted particle detectors
- H01J 2237/2446 Position sensitive detectors
- H01J 2237/24475 Scattered electron detectors
- H01J 2237/2448 Secondary particle detectors
- H01J 2237/24485 Energy spectrometers
- H01J 2237/2449 Detector devices with moving charges in electric or magnetic fields
- H01J 2237/24495 Signal processing, e.g. mixing of two or more signals
Top Applicants
Top 10 applicants by patent filingsfor class H01, 2013–2023, worldwide · Source: EPO PATSTAT
- SAMSUNG ELECTRONICS COMPANY KR 37,897
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 36,116
- APPLIED MATERIALS US 21,640
- LG ENERGY SOLUTION KR 20,770
- LG CHEM KR 19,835
- TOKYO ELECTRON JP 18,519
- ROBERT BOSCH DE 14,595
- INTEL CORPORATION US 13,580
- MURATA MANUFACTURING COMPANY JP 12,151
- SAMSUNG SDI COMPANY KR 12,080