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CPC Subgroup Additional Only
H01J 2237/24514

Beam diagnostics including control of the parameter or property diagnosed (H01J2237/30472 takes precedence)

Full Title

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging > Detection characterised by the variable being measured > Intensity, dose or other characteristics of particle beams or electromagnetic radiation > Beam diagnostics including control of the parameter or property diagnosed (H01J2237/30472 takes precedence)

4 direct subcodes

Child Classifications

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Top Applicants

Top 10 applicants by patent filingsfor class H01, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SAMSUNG ELECTRONICS COMPANY KR 37,897
  2. TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 36,116
  3. APPLIED MATERIALS US 21,640
  4. LG ENERGY SOLUTION KR 20,770
  5. LG CHEM KR 19,835
  6. TOKYO ELECTRON JP 18,519
  7. ROBERT BOSCH DE 14,595
  8. INTEL CORPORATION US 13,580
  9. MURATA MANUFACTURING COMPANY JP 12,151
  10. SAMSUNG SDI COMPANY KR 12,080