CPC Subgroup Additional Only
H01J 2237/24514 Beam diagnostics including control of the parameter or property diagnosed (H01J2237/30472 takes precedence)
Full Title
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging > Detection characterised by the variable being measured > Intensity, dose or other characteristics of particle beams or electromagnetic radiation > Beam diagnostics including control of the parameter or property diagnosed (H01J2237/30472 takes precedence)
4 direct subcodes
Child Classifications
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- H01J 2237/24521 Beam diameter
- H01J 2237/24528 Direction of beam or parts thereof in view of the optical axis, e.g. beam angle, angular distribution, beam divergence, beam convergence or beam landing angle on sample or workpiece
- H01J 2237/24535 Beam current
- H01J 2237/24542 Beam profile
Top Applicants
Top 10 applicants by patent filingsfor class H01, 2013–2023, worldwide · Source: EPO PATSTAT
- SAMSUNG ELECTRONICS COMPANY KR 37,897
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 36,116
- APPLIED MATERIALS US 21,640
- LG ENERGY SOLUTION KR 20,770
- LG CHEM KR 19,835
- TOKYO ELECTRON JP 18,519
- ROBERT BOSCH DE 14,595
- INTEL CORPORATION US 13,580
- MURATA MANUFACTURING COMPANY JP 12,151
- SAMSUNG SDI COMPANY KR 12,080