CPC Subgroup
H10W 20/47 comprising two or more dielectric layers having different properties, e.g. different dielectric constants
Full Title
Interconnections in chips, wafers or substrates > Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes > characterised by their insulating parts > comprising two or more dielectric layers having different properties, e.g. different dielectric constants