Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes > using incident ion beams, e.g. proton beams > Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > using electron or ion > using incident ion beams, e.g. proton beams > Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]