using incident ion beams, e.g. proton beams

Introduced: January 2018

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes > using incident ion beams, e.g. proton beams

CPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > using electron or ion > using incident ion beams, e.g. proton beams

IPC and CPC are identically structured here. All 2 subcodes exist in both systems.

1 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 2018.

Child Classifications

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G01N 23/2257 Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE] since 2018 IPC+CPC Available in IPC and CPC
G01N 23/2258 Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS] (mass-to-charge ratio analysis aspects of SIMS for material analysis G01N27/62) since 2018 IPC+CPC Available in IPC and CPC