IPC Main Group
G01Q 60/00 Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
9 direct subcodes
Child Classifications
Navigate with arrow keys, Enter to open
- G01Q 60/02 Multiple-type SPM, i.e. involving two or more SPM techniques
- G01Q 60/1 STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q 60/18 SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q 60/44 SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
- G01Q 60/46 SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes
- G01Q 60/5 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
- G01Q 60/58 SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
- G01Q 60/6 SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes