AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

Introduced: January 2010

Full Title

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

6 direct subcodes

Child Classifications

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G01Q 60/26 Friction force microscopy
G01Q 60/28 Adhesion force microscopy
G01Q 60/3 Scanning potential microscopy
G01Q 60/32 AC mode
G01Q 60/36 DC mode
G01Q 60/38 Probes, their manufacture or their related instrumentation, e.g. holders