CPC Subgroup
G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
Full Title
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
6 direct subcodes
Child Classifications
Navigate with arrow keys, Enter to open
- G01Q 60/26 Friction force microscopy
- G01Q 60/28 Adhesion force microscopy
- G01Q 60/30 Scanning potential microscopy
- G01Q 60/32 AC mode
- G01Q 60/36 DC mode
- G01Q 60/38 Probes, their manufacture, or their related instrumentation, e.g. holders
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382