Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 )

Introduced: September 1968

Title

Titles differ between systems:

IPC: Testing of electronic circuits, e.g. by signal tracer

CPC: Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 )

Full Title

Full titles differ between systems:

IPC:

CPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 )

Additional Content IPC

Testing computers during standby operation or idle time

Of 9 combined children, 5 exist in both systems.

4 codes are CPC-only extensions.

1 shared codes have differing titles between IPC and CPC.

Child Classifications

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G01R 31/2801 +5 CPC CPC only CPC only
G01R 31/282 +5 CPC CPC only CPC only
G01R 31/2832 +2 CPC CPC only CPC only
G01R 31/2851 +9 CPC CPC only CPC only
G01R 31/30 Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22) +2 CPC IPC+CPC Available in IPC and CPC
G01R 31/302 Contactless testing since 1990 +1 CPC IPC+CPC Available in IPC and CPC
G01R 31/316 Testing of analog circuits since 1995 IPC+CPC Available in IPC and CPC
G01R 31/3167 Testing of combined analog and digital circuits since 1995 IPC+CPC Available in IPC and CPC
G01R 31/317 Testing of digital circuits since 1995 +19 CPC IPC+CPC Available in IPC and CPC

Top Applicants

Top Applicants (IPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

SGCC(STATE GRID CORPORATION OF CHINA) 41,447
CHINESE ACADEMY OF SCIENCES 32,952
ROBERT BOSCH DE 16,470
SAMSUNG ELECTRONICS COMPANY KR 10,052
SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
ZHEJIANG UNIVERSITY 9,529
GUANGDONG POWER GRID CORPORATION 8,615
TSINGHUA UNIVERSITY 7,805
HALLIBURTON ENERGY SERVICES GROUP US 7,796
QUALCOMM US 7,171

Top Applicants (CPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

CHINESE ACADEMY OF SCIENCES 21,460
ROBERT BOSCH DE 17,801
SGCC(STATE GRID CORPORATION OF CHINA) 17,347
SAMSUNG ELECTRONICS COMPANY KR 13,192
QUALCOMM US 9,900
HALLIBURTON ENERGY SERVICES GROUP US 9,742
PHILIPS ELECTRONICS NL 7,249
MITSUBISHI ELECTRIC CORPORATION JP 6,503
ZHEJIANG UNIVERSITY 6,414
DENSO CORPORATION JP 6,382