Testing of electronic circuits, e.g. by signal tracer

Introduced: September 1968

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

Scope Notes

Limiting references: Testing computers during standby operation or idle time

Related Keywords

SIGNAL(S) tracers

5 direct subcodes

Child Classifications

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G01R 31/3 Marginal testing, e.g. by varying supply voltage
G01R 31/302 Contactless testing
G01R 31/316 Testing of analog circuits
G01R 31/3167 Testing of combined analog and digital circuits
G01R 31/317 Testing of digital circuits