IPC Subgroup
G01R 31/28 Testing of electronic circuits, e.g. by signal tracer
Introduced: September 1968
Last revised: January 2006
Full Title
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
Additional Content
Testing computers during standby operation or idle time
Related Keywords
SIGNAL(S) tracers
5 direct subcodes
Child Classifications
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- G01R 31/3 Marginal testing, e.g. by varying supply voltage
- G01R 31/302 Contactless testing
- G01R 31/316 Testing of analog circuits
- G01R 31/3167 Testing of combined analog and digital circuits
- G01R 31/317 Testing of digital circuits
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171