Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Full Title

Checking stores for correct operation; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Classification Context

Section:

PHYSICS

Class:

INFORMATION STORAGE

Subclass:

STATIC STORES

Child Classifications

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• G11C 29/1 Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
• G11C 29/12 Built-in arrangements for testing, e.g. built-in self testing [BIST]
• G11C 29/48 Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths