G11C 29/42 using error correcting codes [ECC] or parity check
Introduced: January 2006
Full Title
Full titles differ between systems:
Checking stores for correct operation; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Built-in arrangements for testing, e.g. built-in self testing [BIST] > Response verification devices > using error correcting codes [ECC] or parity check
Checking stores for correct operation ; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Built-in arrangements for testing, e.g. built-in self testing [BIST] > Response verification devices > using error correcting codes [ECC] or parity check
No child classifications to compare. This is a leaf node in both IPC and CPC.
Top Applicants
Top Applicants (IPC)
Class G11,2013–2023, worldwide · Source: EPO PATSTAT
- MICRON TECHNOLOGY US 10,574
- SK HYNIX KR 9,138
- SAMSUNG ELECTRONICS COMPANY KR 9,004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 3,739
- IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 3,443
- INTEL CORPORATION US 2,952
- SANDISK TECHNOLOGIES US 2,905
- WESTERN DIGITAL TECHNOLOGIES US 2,630
- TOSHIBA CORPORATION JP 2,593
- SEAGATE TECHNOLOGY US 2,472
Top Applicants (CPC)
Class G11,2013–2023, worldwide · Source: EPO PATSTAT
- MICRON TECHNOLOGY US 12,397
- SAMSUNG ELECTRONICS COMPANY KR 12,238
- SK HYNIX KR 11,371
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 4,601
- INTEL CORPORATION US 3,874
- IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 3,866
- SANDISK TECHNOLOGIES US 3,151
- SK HYNIX 3,143
- SAMSUNG ELECTRONICS COMPANY 3,073
- WESTERN DIGITAL TECHNOLOGIES US 2,961