using frequency scans

Full Title

Measuring instruments characterised by the use of optical techniques > Interferometers > characterised by controlling or generating intrinsic radiation properties > using two or more frequencies > using frequency scans

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS