Multipass interferometers, e.g. double-pass

Full Title

Measuring instruments characterised by the use of optical techniques > Interferometers > characterised by the beam path configuration > with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations > Multipass interferometers, e.g. double-pass

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS