IPC Subgroup
G01R 23/175 by delay means, e.g. tapped delay lines
Introduced: January 1980
Last revised: January 2006
Full Title
Arrangements for measuring frequencies; Arrangements for analysing frequency spectra > Spectrum analysis; Fourier analysis > by delay means, e.g. tapped delay lines
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES