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IPC Subgroup
G01R 27/3

with provision for recording characteristics, e.g. by plotting Nyquist diagram

Introduced: September 1968

Last revised: January 2006

Full Title

Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom > Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response > with provision for recording characteristics, e.g. by plotting Nyquist diagram

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

Top Applicants

Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SGCC(STATE GRID CORPORATION OF CHINA) 41,447
  2. CHINESE ACADEMY OF SCIENCES 32,952
  3. ROBERT BOSCH DE 16,470
  4. SAMSUNG ELECTRONICS COMPANY KR 10,052
  5. SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
  6. ZHEJIANG UNIVERSITY 9,529
  7. GUANGDONG POWER GRID CORPORATION 8,615
  8. TSINGHUA UNIVERSITY 7,805
  9. HALLIBURTON ENERGY SERVICES GROUP US 7,796
  10. QUALCOMM US 7,171