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IPC Subgroup
G01R 31/12

Testing dielectric strength or breakdown voltage

Introduced: September 1968

Last revised: January 2020

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing dielectric strength or breakdown voltage

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

Related Keywords

testing for BREAKDOWN voltagetesting DIELECTRIC(S) strength

4 direct subcodes

Child Classifications

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  • G01R 31/14 Circuits therefor
  • G01R 31/16 Construction of testing vessels; Electrodes therefor
  • G01R 31/18 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production
  • G01R 31/2 Preparation of articles or specimens to facilitate testing

Top Applicants

Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SGCC(STATE GRID CORPORATION OF CHINA) 41,447
  2. CHINESE ACADEMY OF SCIENCES 32,952
  3. ROBERT BOSCH DE 16,470
  4. SAMSUNG ELECTRONICS COMPANY KR 10,052
  5. SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
  6. ZHEJIANG UNIVERSITY 9,529
  7. GUANGDONG POWER GRID CORPORATION 8,615
  8. TSINGHUA UNIVERSITY 7,805
  9. HALLIBURTON ENERGY SERVICES GROUP US 7,796
  10. QUALCOMM US 7,171