in thin-film element

Introduced: January 1980

Last revised: January 2006

Full Title

Arrangements or instruments for measuring magnetic variables > Measuring direction or magnitude of magnetic fields or magnetic flux > using the flux-gate principle > in thin-film element

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

Top Applicants

Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT

SGCC(STATE GRID CORPORATION OF CHINA) 41,447
CHINESE ACADEMY OF SCIENCES 32,952
ROBERT BOSCH DE 16,470
SAMSUNG ELECTRONICS COMPANY KR 10,052
SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
ZHEJIANG UNIVERSITY 9,529
GUANGDONG POWER GRID CORPORATION 8,615
TSINGHUA UNIVERSITY 7,805
HALLIBURTON ENERGY SERVICES GROUP US 7,796
QUALCOMM US 7,171