Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns

Full Title

Checking stores for correct operation; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns

Classification Context

Section:

PHYSICS

Class:

INFORMATION STORAGE

Subclass:

STATIC STORES