Testing or measuring during manufacture or treatment of wafers, substrates or devices

Classification Context

Section:

ELECTRICITY

Class:

SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR

Subclass:

GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS

Child Classifications

Navigate with arrow keys, Enter to open

• H10P 74/2 characterised by the properties tested or measured, e.g. structural or electrical properties