by measuring secondary emission from the material

Full Title

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Child Classifications

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• G01N 23/2202 Preparing specimens therefor
• G01N 23/2204 Specimen supports therefor; Sample conveying means therefor
• G01N 23/2206 Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
• G01N 23/2209 using wavelength dispersive spectroscopy [WDS]
• G01N 23/221 by activation analysis
• G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• G01N 23/225 using electron or ion microprobes
• G01N 23/227 Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM]