IPC Subgroup
G01N 23/227 Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM]
Introduced: July 1974
Last revised: January 2018
Full Title
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM]
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2 direct subcodes
Child Classifications
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- G01N 23/2273 Measuring photoelectron spectra, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
- G01N 23/2276 using the Auger effect, e.g. Auger electron spectroscopy [AES]