Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Introduced: July 1974

Title

Titles differ between systems:

IPC: Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM]

CPC: Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM]

CPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

IPC and CPC are identically structured here. All 2 subcodes exist in both systems.

1 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 2018.

Child Classifications

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G01N 23/2273 Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS] since 2018 IPC+CPC Available in IPC and CPC
G01N 23/2276 using the Auger effect, e.g. Auger electron spectroscopy [AES] since 2018 IPC+CPC Available in IPC and CPC