SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

Introduced: January 2010

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

Description

Covers scanning-probe microscopy and related techniques that use a fine probe to mechanically or electrochemically interact with a sample surface to obtain topographical, electrical, magnetic, or chemical information at micro- and nanoscale resolution. Includes atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near-field optical microscopy (SNOM), and similar probe-based characterization methods. Encompasses both apparatus design (probe configurations, positioning mechanisms, signal detection systems) and methodology for materials analysis, surface imaging, and nanoscale manipulation. Excludes conventional optical or electron microscopy techniques covered in G01B and other measurement systems not based on scanning-probe interaction principles.

Related Keywords

MEASURERING or analysis of nanostructuresmethods or apparatus for measurement or analysis of NANOSTRUCTURES

8 direct subcodes

Child Classifications

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G01Q 10/00 Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
G01Q 20/00 Monitoring the movement or position of the probe
G01Q 30/00 Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
G01Q 40/00 Calibration, e.g. of probes
G01Q 60/00 Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
G01Q 70/00 General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group
G01Q 80/00 Applications, other than SPM, of scanning-probe techniques
G01Q 90/00 Scanning-probe techniques or apparatus not otherwise provided for