G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Description
Covers scanning-probe microscopy and related techniques that use a fine probe to mechanically or electrochemically interact with a sample surface to obtain topographical, electrical, magnetic, or chemical information at micro- and nanoscale resolution. Includes atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near-field optical microscopy (SNOM), and similar probe-based characterization methods. Encompasses both apparatus design (probe configurations, positioning mechanisms, signal detection systems) and methodology for materials analysis, surface imaging, and nanoscale manipulation. Excludes conventional optical or electron microscopy techniques covered in G01B and other measurement systems not based on scanning-probe interaction principles.
Filing statistics
IPC subclass G01Q recorded 6,119 patent applications worldwide between 2013 and 2023. Annual filings declined from 519 in 2013 to 493 in 2023 (-5%), peaking at 629 applications in 2017. The most active applicants in class G01 are SGCC(STATE GRID CORPORATION OF CHINA) (41,447 applications), CHINESE ACADEMY OF SCIENCES (32,952 applications) and ROBERT BOSCH (16,470 applications).
Source: EPO PATSTAT, worldwide filings
Related Keywords
8 direct subcodes
Child Classifications
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- G01Q 10/00 Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q 20/00 Monitoring the movement or position of the probe
- G01Q 30/00 Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q 40/00 Calibration, e.g. of probes
- G01Q 60/00 Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
- G01Q 70/00 General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group
- G01Q 80/00 Applications, other than SPM, of scanning-probe techniques
- G01Q 90/00 Scanning-probe techniques or apparatus not otherwise provided for
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171